CA-1000 Chip Tester

CA-1000 Chip Tester

Description

ETSC Sip-Chip/Bar automatic test system covers a variety of chips, including passive and active chips. The system uses required instruments to test chip performance indexes, such as IL, ER, RL FSR, Responsivity, etc. Vision algorithm can realize automatic optical-alignment and probe card contact with pad, without human beings’ participation.

The coupling mode includes Grating-Coupler and Edge-Coupler. Response mode could either be optical feedback (power meter) or electric feedback (source meter). Optical-mode the system supports is at least 1.5um, if need be, replacement of motor type can support smaller mode chip test.

Parameter


X

Y

Z

ThetaX

ThetaY

ThetaZ

Coupling Stage

Travel range

>=30mm

>=30mm

>=30mm

>=8deg

>=8deg

>=8deg

Resolution

<= 50nm

<= 50nm

<= 50nm

<= 0.003deg

<= 0.003deg

<= 0.003deg

Repeatability

<= 1um

<= 1um

<= 1um

<= 0.02deg

<= 0.02deg

<= 0.02deg

Optical-align time

<10s for single fiber

<1min for fiber array

Optical-align repeatability

SMF-SiPh variation < 0.2dB

Stability

15min < 0.5dB

User-Case
  1. 2 SMF-Edge coupler
  2. 2 SMF-Grating coupler
  3. 1 1x4 FA-Edge coupler
  4. 1 1x8 FA-Grating coupler
  5. Response: Power or PD

Download

CA-1000


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